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Neutron diffraction studies of a high resolution double crystal (+n,-m) setting containing Si(220) and Si(311) bent perfect crystals in symmetric and fully asymmetric diffraction geometry, respectively

In this paper studies of neutron diffraction properties of the double crystal (+n,-m) setting containing Si(220) and Si(311) bent perfect crystals (BPC) in symmetric and fully asymmetric diffraction (FAD) geometry with the output beam expansion (OBE), respectively, are presented. Namely, our attenti...

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Bibliographic Details
Published in:Journal of physics. Conference series 2014-01, Vol.528 (1), p.12004-7
Main Authors: Mikula, P, Vrána, M, Seong, B S, Woo, W, Em, V, Korytár, D
Format: Article
Language:English
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Summary:In this paper studies of neutron diffraction properties of the double crystal (+n,-m) setting containing Si(220) and Si(311) bent perfect crystals (BPC) in symmetric and fully asymmetric diffraction (FAD) geometry with the output beam expansion (OBE), respectively, are presented. Namely, our attention was focused on the properties of the FAD geometry of the BPC Si(311) crystal slab. It has been found that after a beam expansion this FAD geometry can provide a monochromatic beam of a rather large cross-section and of very small divergence with some possible application use.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/528/1/012004