Three-Dimensional Characterization of Microstructure by Electron Back-Scatter Diffraction

The characterization of microstructures in three dimensions is reviewed, with an emphasis on the use of automated electron back-scatter diffraction techniques. Both statistical reconstruction of polycrystalline structures from multiple cross sections and reconstruction from parallel, serial sections...

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Bibliographic Details
Published in:Annual review of materials research 2007-01, Vol.37 (1), p.627-658
Main Authors: Rollett, Anthony D, Lee, S-B, Campman, R, Rohrer, G S
Format: Article
Language:English
Subjects:
Cross sections
Diffraction
Electron back scatter diffraction
Microstructure
Reconstruction
Scatter
Serials
Three dimensional
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Summary:The characterization of microstructures in three dimensions is reviewed, with an emphasis on the use of automated electron back-scatter diffraction techniques. Both statistical reconstruction of polycrystalline structures from multiple cross sections and reconstruction from parallel, serial sections are discussed. In addition, statistical reconstruction of second- phase particle microstructures from multiple cross sections is reviewed.
ISSN:1531-7331
1545-4118
DOI:10.1146/annurev.matsci.37.052506.084401