Electron channelling contrast observations in deformed Mg alloys prepared with ion milling

Electron channelling contrast imaging (ECCI) was used in the cold-field emission scanning electron microscope (CFE-SEM) to image the microstructure on deformed bulk specimen. Imaging was conducted with a pole-piece mounted silicon photodiode detector at 5 keV to collect backscattered electrons gener...

Full description

Saved in:
Bibliographic Details
Published in:IOP conference series. Materials Science and Engineering 2014-01, Vol.55 (1), p.12007-7
Main Authors: Kaboli, S, Pinard, P T, Su, J, Yue, S, Gauvin, R
Format: Article
Language:English
Subjects:
Aluminum
Aluminum base alloys
Backscattering
Compression tests
Deformation
Electron channelling
Electron microscopes
Field emission microscopy
Grain boundaries
Imaging
Ion beams
Magnesium base alloys
Parents
Photodiode detectors
Scanning electron microscopy
Surface layers
Surface preparation
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Electron channelling contrast imaging (ECCI) was used in the cold-field emission scanning electron microscope (CFE-SEM) to image the microstructure on deformed bulk specimen. Imaging was conducted with a pole-piece mounted silicon photodiode detector at 5 keV to collect backscattered electrons generated from a low-tilted (0 – 3 degrees) specimen. Broad ion beam milling surface preparation technique was used to remove surface layers and reveal near-surface deformation features. The uniaxial hot-compression tests were conducted on Mg-0.3 wt% Al-0.2 wt% Ca alloy. ECCI observations on deformed bulk specimen showed irregular and complex channelling contrast variations inside parent grains and low angle grain boundaries originated from parent grain boundaries. ECCI on an ion milled prepared surface provides non-destructive and rapid visualisation and characterisation of strain fields along with near-surface deformation substructures in CFE-SEM.
ISSN:1757-899X
1757-8981
1757-899X
DOI:10.1088/1757-899X/55/1/012007