Electron channelling contrast observations in deformed Mg alloys prepared with ion milling

• Published in: IOP conference series. Materials Science and Engineering 2014-01, Vol.55 (1), p.12007-7
• Main Authors: Kaboli, S, Pinard, P T, Su, J, Yue, S, Gauvin, R
• Format: Article
• Language: English
• Subjects: Aluminum; Aluminum base alloys; Backscattering; Compression tests; Deformation; Electron channelling; Electron microscopes; Field emission microscopy; Grain boundaries; Imaging; Ion beams; Magnesium base alloys; Parents; Photodiode detectors; Scanning electron microscopy; Surface layers; Surface preparation
• ISSN: 1757-899X; 1757-8981; 1757-899X
• DOI: 10.1088/1757-899X/55/1/012007

Electron channelling contrast imaging (ECCI) was used in the cold-field emission scanning electron microscope (CFE-SEM) to image the microstructure on deformed bulk specimen. Imaging was conducted with a pole-piece mounted silicon photodiode detector at 5 keV to collect backscattered electrons generated from a low-tilted (0 – 3 degrees) specimen. Broad ion beam milling surface preparation technique was used to remove surface layers and reveal near-surface deformation features. The uniaxial hot-compression tests were conducted on Mg-0.3 wt% Al-0.2 wt% Ca alloy. ECCI observations on deformed bulk specimen showed irregular and complex channelling contrast variations inside parent grains and low angle grain boundaries originated from parent grain boundaries. ECCI on an ion milled prepared surface provides non-destructive and rapid visualisation and characterisation of strain fields along with near-surface deformation substructures in CFE-SEM.