Quantitative transmission electron microscopy at atomic resolution

In scanning transmission electron microscopy (STEM) it is possible to operate the microscope in bright-field mode under conditions which, by the quantum mechanical principle of reciprocity, are equivalent to those in conventional transmission electron microscopy (CTEM). The results of such an experi...

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Bibliographic Details
Published in:Journal of physics. Conference series 2012-07, Vol.371 (1), p.12009-4
Main Authors: Allen, L J, D'Alfonso, A J, bes, B D, Findlay, S D, LeBeau, J M, Stemmer, S
Format: Article
Language:English
Subjects:
Atomic force microscopy
Electrons
Equivalence
Microscopes
Physics
Quantum mechanics
Reciprocity
Scanning electron microscopy
Scanning transmission electron microscopy
Transmission electron microscopy
Variance
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Summary:In scanning transmission electron microscopy (STEM) it is possible to operate the microscope in bright-field mode under conditions which, by the quantum mechanical principle of reciprocity, are equivalent to those in conventional transmission electron microscopy (CTEM). The results of such an experiment will be presented which are in excellent quantitative agreement with theory for specimens up to 25 nm thick. This is at variance with the large contrast mismatch (typically between two and five) noted in equivalent CTEM experiments. The implications of this will be discussed.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/371/1/012009