Atomic motion on various surfaces of ceria nanoparticles in comparison

Aberration corrected HRTEM has been successfully applied to image the atomic motion at the edges and surfaces of nanoparticles of ceria of various types under electron irradiation. Here we identify movements not only on {100} facets, but also on {110} and even {111} facets, previously considered sta...

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Bibliographic Details
Published in:Journal of physics. Conference series 2012-01, Vol.371 (1), p.12007-4
Main Authors: Bhatta, U M, Ross, I M, Saghi, Z, Stringfellow, A, Sayle, D, Sayle, T X T, Karakoti, A, Reid, D, Seal, S, Möbus, G
Format: Article
Language:English
Subjects:
Aberration
Carbon
Cerium oxide
Cerium oxides
Electron irradiation
Movements
Nanoparticles
Physics
Scanning probe microscopy
Spatial resolution
Stability
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Summary:Aberration corrected HRTEM has been successfully applied to image the atomic motion at the edges and surfaces of nanoparticles of ceria of various types under electron irradiation. Here we identify movements not only on {100} facets, but also on {110} and even {111} facets, previously considered stable. However, the degree of movement varies strongly and HRTEM is evidently the preferred technique to measure relative stability at high spatial resolution as it does not require extended surfaces as in scanning probe microscopy (SPM) or chemical methods. The advantage of aberration correction shows in suppression of contrast from the carbon support films and the absence of delocalisation fringes at particle edges, apart from improving point resolution.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/371/1/012007