Scanning tunneling potentiometry implemented into a multi-tip setup by software

We present a multi-tip scanning tunneling potentiometry technique that can be implemented into existing multi-tip scanning tunneling microscopes without installation of additional hardware. The resulting setup allows flexible in situ contacting of samples under UHV conditions and subsequent measurem...

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Bibliographic Details
Published in:Review of scientific instruments 2015-12, Vol.86 (12), p.123701-123701
Main Authors: Lüpke, F, Korte, S, Cherepanov, V, Voigtländer, B
Format: Article
Language:English
Subjects:
Electrical measurement
Microscopes
Potentiometric analysis
Scientific apparatus & instruments
Standing waves
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Summary:We present a multi-tip scanning tunneling potentiometry technique that can be implemented into existing multi-tip scanning tunneling microscopes without installation of additional hardware. The resulting setup allows flexible in situ contacting of samples under UHV conditions and subsequent measurement of the sample topography and local electric potential with resolution down to Å and μV, respectively. The performance of the potentiometry feedback is demonstrated by thermovoltage measurements on the Ag/Si(111)-(√3×√3)R30° surface by resolving a standing wave pattern. Subsequently, the ability to map the local transport field as a result of a lateral current through the sample surface is shown on Ag/Si(111)-(√3×√3)R30° and Si(111) - (7 × 7) surfaces.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4936079