Investigation of Novel Noncontacting Measurement Method by the Design of Loop-Type Probe and Reconstruction of Radiation Modeling

Because the ICs’ application frequency and speed become higher and trends of system packaging and device under test request higher reliability, a novel technology combining noncontacting measurement method and reconstructing radiation model was proposed to solve signal deliveries in system packages...

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Bibliographic Details
Published in:Mathematical problems in engineering 2015-01, Vol.2015 (2015), p.1-8
Main Authors: Li, Hsin-Fang, Yeh, Yin-Hsiu, Yang, Cheng-Fu, Wu, Sung-Mao, Hsu, Ren-Fang
Format: Article
Language:English
Subjects:
Circuits
Connectors
Curve fitting
Design
Design engineering
Integrated circuits
Mathematical models
Mathematical problems
Measurement methods
Measurement techniques
Modelling
Near fields
Radiation measurement
Reconstruction
Studies
Theorems
Citations: Items that this one cites
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Summary:Because the ICs’ application frequency and speed become higher and trends of system packaging and device under test request higher reliability, a novel technology combining noncontacting measurement method and reconstructing radiation model was proposed to solve signal deliveries in system packages or PCBs. In this study, a novel noncontacting method for the ICs’ measurements was investigated by the design of loop-type near-field probe and reconstructed the radiation model to substitute the traditional measurement methods, such as using probes and SMA connectors. A near-field probe was used to receive the coupling signal. The assessing circuit modeling could be completed by some synthesized theorems. According to the study’s results, frequency responses of reconstruction model developed by theorems, radiation measurements, and simulated by EM methods were highly curve fitting.
ISSN:1024-123X
1563-5147
DOI:10.1155/2015/146406