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Effect of Undercut on the Characterization of the Mechanical Properties of Silicon Nanocantilevers with Dynamic and Static Test
The elastic mechanical properties of silicon nano-cantilevers are of prime importance in biotechnology and nano-electro-mechanical system (NEMS) applications. In order to make these applications reliable, the exact evaluation of the effect of the undercut on the mechanical properties of silicon nano...
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Published in: | Key engineering materials 2015-05, Vol.645-646, p.1072-1077 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | The elastic mechanical properties of silicon nano-cantilevers are of prime importance in biotechnology and nano-electro-mechanical system (NEMS) applications. In order to make these applications reliable, the exact evaluation of the effect of the undercut on the mechanical properties of silicon nano-cantilevers is essential and critical. In this paper, a numerical-experimental method for determining the effect of the undercut on resonant frequencies and Young's modulus of silicon nano-cantilevers is proposed by combining finite element (FE) analysis and dynamic frequency response tests by using laser Doppler vibrometer (LDV) as well as static force-displacement curve test by using an atomic force microscope (AFM). Silicon nano-cantilevers test structures are fabricated from silicon-on-insulator (SOI) wafers by using the standard complementary metal-oxide-semiconductor (CMOS) lithography process and anisotropic wet-etch release process based on the critical point drying, which inevitably generating the undercut of the nano-cantilever clamping. Our work reveals that the effect of the undercut on the characterization of the mechanical properties of nano-cantilevers with dynamic and static test must be carefully considered. |
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ISSN: | 1013-9826 1662-9795 |
DOI: | 10.4028/www.scientific.net/KEM.645646.1072 |