Influence of Solvent and Solvent Additive on the Morphology of PTB7 Films Probed via X‑ray Scattering

Films of the semiconducting polymer poly[[4,8-bis[(2-ethylhexyl)oxy]benzo[1,2-b:4,5-b′]dithiophene-2,6-diyl][3-fluoro-2-[(2-ethylhexyl)carbonyl]thieno[3,4-b]thiophenediyl]] with 40% fluorinated monomers, denoted PTB7-F40, are spin coated out of different solvents onto PEDOT:PSS films. The influence...

Full description

Saved in:
Bibliographic Details
Published in:The journal of physical chemistry. B 2014-01, Vol.118 (1), p.344-350
Main Authors: Guo, Shuai, Herzig, Eva M, Naumann, Anna, Tainter, Gregory, Perlich, Jan, Müller-Buschbaum, Peter
Format: Article
Language:English
Subjects:
Additives
Correlation
Crystal structure
Monomers
Roughness
Solvents
Wide angle X ray scattering
X-rays
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Films of the semiconducting polymer poly[[4,8-bis[(2-ethylhexyl)oxy]benzo[1,2-b:4,5-b′]dithiophene-2,6-diyl][3-fluoro-2-[(2-ethylhexyl)carbonyl]thieno[3,4-b]thiophenediyl]] with 40% fluorinated monomers, denoted PTB7-F40, are spin coated out of different solvents onto PEDOT:PSS films. The influence of the used solvents chlorobenzene, 1,2-dichlorobenzene, and 1,2,4-trichlorobenzene as well as the influence of the additive 1,8-diiodooctane (DIO) is probed with grazing incidence small- and wide-angle X-ray scattering (GISAXS and GIWAXS). As seen with GISAXS, without DIO, the films are homogeneous and show roughness correlation with the PEDOT:PSS film surface. With DIO, an inner film structure with a size of 50–75 nm is found and the roughness correlations weaken. In addition, as seen in GIWAXS, the crystalline part of the films is influenced by the used solvent if DIO is added.
ISSN:1520-6106
1520-5207
DOI:10.1021/jp410075a