Properties of SFS heterostructures prepared by a focused-ion-beam technique

We present a study of superconductor-ferromagnet (SF) bilayers and superconductor-ferromagnet-superconductor (SFS) heterostructures of nanometer dimensions prepared by a gallium focused-ion-beam (FIB) technique. The SFS heterostructures were implemented on the basis of high-Tc superconducting YBa2Cu...

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Bibliographic Details
Published in:Journal of physics. Conference series 2012-01, Vol.356 (1), p.12021-4
Main Authors: Štrbík, V, Beňačka, Š, Šmatko, V, Gaži, Š, Chromik, Š, Mateev, E, Blagoev, B, Nurgaliev, T
Format: Article
Language:English
Subjects:
Bilayers
COPPER OXIDE
DEPOSITION
Electrons
Ferromagnetic materials
Gallium
Heterostructures
Ion beams
Links
MAGNETIC PROPERTIES
Magnetron sputtering
MICROSTRUCTURES
Nanostructure
Physics
SINGLE CRYSTALS
Strontium titanates
Substrates
SUPERCONDUCTIVITY
SUPERCONDUCTORS
THIN FILMS
YBCO superconductors
YTTRIUM OXIDE
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Summary:We present a study of superconductor-ferromagnet (SF) bilayers and superconductor-ferromagnet-superconductor (SFS) heterostructures of nanometer dimensions prepared by a gallium focused-ion-beam (FIB) technique. The SFS heterostructures were implemented on the basis of high-Tc superconducting YBa2Cu3Ox (YBCO) and ferromagnetic La0.67Sr0.33MnO3 (LSMO) thin films deposited by magnetron sputtering on SrTiO3 (100) single crystal substrates. SFS weak link junctions require weak link dimensions in the range of nanometer size realizable by FIB patterning. On the other hand, the focused gallium ion beam might cause unacceptable degradation of the superconducting and ferromagnetic thin film properties. Our results confirm such influence of the FIB technology. However, protection of the structures by a gold thin film may effectively solve this problem, as is presented in the paper.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/356/1/012021