Fast measurement of a pulsed plasma using a Fourier cutoff probe

A new method for time-resolved measurement of pulsed plasmas is suggested for reducing the measurement time. A short impulse has a broadband spectrum, and it can be used to make a spectrum in a short time. The use of a cutoff probe with a Fourier analysis (Fourier Cutoff Probe, FCP) provides the abs...

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Bibliographic Details
Published in:Journal of instrumentation 2012-04, Vol.7 (4), p.1-10
Main Authors: Na, B-K, You, K-H, Kim, D-W, Seo, B-H, Chang, H-Y, You, S-J, Lee, Y-S
Format: Article
Language:English
Subjects:
Broadband
Diagnostic systems
Electron density
Fourier analysis
High speed
Impulses
Instrumentation
Temporal logic
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Summary:A new method for time-resolved measurement of pulsed plasmas is suggested for reducing the measurement time. A short impulse has a broadband spectrum, and it can be used to make a spectrum in a short time. The use of a cutoff probe with a Fourier analysis (Fourier Cutoff Probe, FCP) provides the absolute electron densities with high speed. The measurement results from the FCP show good agreement with Langmuir probe's measurement results. However, it took only 1 minute 45 seconds using the FCP to make the temporal profile of electron densities in a pulsed plasma, versus 46 minutes for the Langmuir probe. The FCP's measurement was about 26 times faster than that by the Langmuir probe. This method will provide researchers a faster and convenient diagnostic method for pulsed plasmas.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/7/04/C04022