Ellipsometric Porosimetry and Electrochemical Impedance Spectroscopy Characterization for Moisture Permeation Barrier Layers

• Published in: Plasma processes and polymers 2015-09, Vol.12 (9), p.968-979
• Main Authors: Perrotta, Alberto, García, Santiago J., Creatore, Mariadriana
• Format: Article
• Language: English
• Subjects: Barrier layers; Defects; Electrochemical impedance spectroscopy; ellipsometric porosimetry; Ellipsometry; Moisture; moisture permeation barriers; Nanostructure; PE-CVD; Penetration; Pore size; Porosity; residual nanoporosity; Spectrum analysis
• ISSN: 1612-8850; 1612-8869
• DOI: 10.1002/ppap.201500084

In this work the combination of ellipsometric porosimetry (EP) and electrochemical impedance spectroscopy (EIS) is extensively addressed in order to characterize the nano‐porosity and further elucidate its influence on the water permeation properties of plasma enhanced‐CVD SiO2 layers. Pores with diameter in the range of 0.27–0.6 nm are studied by adopting a multi‐solvent/multi‐ion approach, with EP and EIS, respectively. This combined study has brought to conclude that open pores larger than 0.42 nm are responsible for WVTR values in the range of 10−3‐10−5 gm−2 day−1, while pores with diameter between 0.42–0.27 nm were found to drive the transition to excellent moisture barrier layers (10−6 gm−2 day−1). Moreover, it is shown that EIS is capable of detecting macro‐scale defects, next to nano‐porosity, being thus a powerful tool for the analysis of moisture barrier layers. Electrochemical impedance spectroscopy (EIS) and ellipsometric porosimetry (EP) are combined for the characterization of the nanoporosity and pore size distribution of PE‐CVD SiO2 acting as moisture barrier layers. Exploiting the complementary features of the two techniques, the role of specific pore size range in affecting the intrinsic barrier properties is disclosed. Additionally, EIS is found to detect the presence of macro‐scale defects.