Thermally Induced Parametric Instability in a Back-Action Evading Measurement of a Micromechanical Quadrature near the Zero-Point Level

We report the results of back-action evading experiments utilizing a tightly coupled electro-mechanical system formed by a radio frequency micromechanical resonator parametrically coupled to a NbTiN superconducting microwave resonator. Due to excess dissipation in the microwave resonator, we observe...

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Bibliographic Details
Published in:Nano letters 2012-12, Vol.12 (12), p.6260-6265
Main Authors: Suh, J, Shaw, M. D, LeDuc, H. G, Weinstein, A. J, Schwab, K. C
Format: Article
Language:English
Subjects:
Applied sciences
Dissipation
Electronics
Exact sciences and technology
Instability
Joining
Micro- and nanoelectromechanical devices (mems/nems)
Microwaves
Nanostructure
Quadratures
Resonators
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Stability
Superconductivity
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Summary:We report the results of back-action evading experiments utilizing a tightly coupled electro-mechanical system formed by a radio frequency micromechanical resonator parametrically coupled to a NbTiN superconducting microwave resonator. Due to excess dissipation in the microwave resonator, we observe a parametric instability induced by a thermal shift of the mechanical resonance frequency. In light of these measurements, we discuss the constraints on microwave dissipation needed to perform BAE measurements far below the zero-point level.
ISSN:1530-6984
1530-6992
DOI:10.1021/nl303353r