Room Temperature Discrimination of Adsorbed Molecules and Attachment Sites on the Si(111)–7 × 7 Surface Using a qPlus Sensor

In this paper, we show that simultaneous noncontact atomic force microscopy (nc-AFM) and scanning tunneling microscopy (STM) is a powerful tool for molecular discrimination on the Si(111)–7 × 7 surface, even at room temperature. Using density functional theory modeling, we justify this approach and...

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Bibliographic Details
Published in:ACS nano 2013-03, Vol.7 (3), p.2686-2692
Main Authors: Majzik, Zsolt, Drevniok, Benedict, Kamiński, Wojciech, Ondráček, Martin, McLean, Alastair B, Jelínek, Pavel
Format: Article
Language:English
Subjects:
Attachment
Density functional theory
Deposition
Discrimination
Nanostructure
Scanning tunneling microscopy
Semiconductors
Vacancies
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Summary:In this paper, we show that simultaneous noncontact atomic force microscopy (nc-AFM) and scanning tunneling microscopy (STM) is a powerful tool for molecular discrimination on the Si(111)–7 × 7 surface, even at room temperature. Using density functional theory modeling, we justify this approach and show that the force response allows us to distinguish straightforwardly between molecular adsorbates and common defects, such as vacancies. Finally, we prove that STM/nc-AFM method is able to determine attachment sites of molecules deposited on semiconductor surface at room temperature.
ISSN:1936-0851
1936-086X
DOI:10.1021/nn400102m