Conductive-AFM Patterning of Organic Semiconductors

Using a conductive atomic force microscope (c‐AFM) redox‐writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline‐based organic (semi)‐conductor thin film using a commercial c‐AFM. I...

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Bibliographic Details
Published in:Small (Weinheim an der Bergstrasse, Germany) Germany), 2015-10, Vol.11 (38), p.5054-5058
Main Authors: Brown, Benjamin P., Picco, Loren, Miles, Mervyn J., Faul, Charl F. J.
Format: Article
Language:English
Subjects:
AFM
Conduction
conductive AFM
Conductivity
Damage
Electric potential
high-speed AFM
Low molecular weights
Nanotechnology
organic semiconductors
Patterning
redox writing
tetraaniline
Thin films
Voltage
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Summary:Using a conductive atomic force microscope (c‐AFM) redox‐writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline‐based organic (semi)‐conductor thin film using a commercial c‐AFM. It is shown that application of a voltage between the tip and sample causes localized redox reactions at the surface without damage.
ISSN:1613-6810
1613-6829
DOI:10.1002/smll.201501779