Sensitive method for measuring third order nonlinearities in compact dielectric and hybrid plasmonic waveguides

We demonstrate a sensitive method for the nonlinear optical characterization of micrometer long waveguides, and apply it to typical silicon-on-insulator nanowires and to hybrid plasmonic waveguides. We demonstrate that our method can detect extremely small nonlinear phase shifts, as low as 7.5·10

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Bibliographic Details
Published in:Optics express 2016-01, Vol.24 (1), p.545-554
Main Authors: Diaz, F J, Hatakeyama, T, Rho, J, Wang, Y, O'Brien, K, Zhang, X, Martijn de Sterke, C, Kuhlmey, B T, Palomba, S
Format: Article
Language:English
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Summary:We demonstrate a sensitive method for the nonlinear optical characterization of micrometer long waveguides, and apply it to typical silicon-on-insulator nanowires and to hybrid plasmonic waveguides. We demonstrate that our method can detect extremely small nonlinear phase shifts, as low as 7.5·10
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.24.000545