Evaluation of absolute form measurements using a tilted-wave interferometer

Tilted-wave interferometry is a promising measurement technique for the highly accurate measurement of aspheres and freeform surfaces. However, the interferometric fringe evaluation of the sub-apertures causes unknown patch offsets, which currently prevent this measurement technique from providing a...

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Bibliographic Details
Published in:Optics express 2016-02, Vol.24 (4), p.3393-3404
Main Authors: Fortmeier, Ines, Stavridis, Manuel, Wiegmann, Axel, Schulz, Michael, Osten, Wolfgang, Elster, Clemens
Format: Article
Language:English
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Summary:Tilted-wave interferometry is a promising measurement technique for the highly accurate measurement of aspheres and freeform surfaces. However, the interferometric fringe evaluation of the sub-apertures causes unknown patch offsets, which currently prevent this measurement technique from providing absolute measurements. Simple strategies, such as constructing differences of optical path length differences (OPDs) or ignoring the piston parameter, can diminish the accuracy resulting from the absolute form measurement. Additional information is needed instead; in this paper, the required accuracy of such information is explored in virtual experiments. Our simulation study reveals that, when one absolute OPD is known within a range of 500 nm, the accuracy of the final measurement result is significantly enhanced.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.24.003393