Low temperature processing of multilayer dielectrics mirrors by sol–gel method

Bragg mirrors (BM) based on TiOx and SiO2 layers were built on glass and PET substrates at operating wavelength in the visible region. The layers were processed by the sol–gel method at room temperature and dried in air for one hour at 100°C (glass) and 70°C (PET). At these deposition conditions, th...

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Bibliographic Details
Published in:Materials letters 2015-12, Vol.161, p.523-526
Main Authors: Alvarado-Beltrán, C.G., Almaral-Sánchez, J.L., Ramirez-Bon, R.
Format: Article
Language:English
Subjects:
Amorphous materials
Deposition
Glass
Multilayer structure
Multilayers
Optical materials and properties
Refractivity
Silicon dioxide
Sol gel process
Sol–gel preparation
Spectra
Thin films
Titanium dioxide
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Summary:Bragg mirrors (BM) based on TiOx and SiO2 layers were built on glass and PET substrates at operating wavelength in the visible region. The layers were processed by the sol–gel method at room temperature and dried in air for one hour at 100°C (glass) and 70°C (PET). At these deposition conditions, the refractive indices of the TiOx and SiO2 layers were 2 and 1.49, respectively. The BM were assembled in a multilayer stack of quarter-wave thickness of alternately high and low refractive index materials. We report the experimental and simulated optical reflection spectra of TiOx–SiO2 BM for different number of layers pairs. •High optical transparence films processed at low temperature.•The refraction index of the TiOx and SiO2 films at 560nm are 2 and 1.49, respectively.•TiOx–SiO2 Bragg mirrors assembled at 70°C on PET and at 100°C on glass substrates.
ISSN:0167-577X
1873-4979
DOI:10.1016/j.matlet.2015.09.020