21.4 A microfluidic-CMOS platform with 3D capacitive sensor and fully integrated transceiver IC for palmtop dielectric spectroscopy

Quantitative measurement of the complex relative dielectric permittivity (ε r ) of a material vs. frequency (i.e., dielectric spectroscopy, or DS) is a powerful monitoring technique that extracts key information on molecular characteristics of the material-under-test (MUT) via its interactions with...

Full description

Saved in:
Bibliographic Details
Main Authors: Bakhshiani, Mehran, Suster, Michael A., Mohseni, Pedram
Format: Conference Proceeding
Language:English
Subjects:
Autonomous
Clocks
Dielectric measurement
Dielectrics
Electric potential
Integrated circuits
Mathematical analysis
Mixers
Monitoring
Radio frequency
Spectroscopy
Three dimensional
Voltage-controlled oscillators
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 3
container_issue
container_start_page 1
container_title
container_volume
creator Bakhshiani, Mehran
Suster, Michael A.
Mohseni, Pedram
description Quantitative measurement of the complex relative dielectric permittivity (ε r ) of a material vs. frequency (i.e., dielectric spectroscopy, or DS) is a powerful monitoring technique that extracts key information on molecular characteristics of the material-under-test (MUT) via its interactions with electromagnetic waves in a broad frequency range. Despite its potential as a label-free, nondestructive, real-time and fully electrical monitoring modality for myriad applications, including structural biology, fermentation monitoring for alcoholic beverages, food safety control and clinical diagnostics, DS is still underutilized as an analytic tool in scientific research or clinical settings. This is due to the dearth of an autonomous, small-sized, low-power and portable instrument to conduct MHz-to-GHz DS measurements without requiring a microwave probe station, benchtop vector network analyzer (VNA) equipment, or large (100's of ml) sample volume.
doi_str_mv 10.1109/ISSCC.2015.7063088
format conference_proceeding
fullrecord <record><control><sourceid>proquest_6IE</sourceid><recordid>TN_cdi_proquest_miscellaneous_1770317709</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7063088</ieee_id><sourcerecordid>1770317709</sourcerecordid><originalsourceid>FETCH-LOGICAL-i539-f87d1cbb7d0c247ed8b54c910c26385b90a022bad4e6f6de148bb757dafa477e3</originalsourceid><addsrcrecordid>eNo1kDlPAzEQhc0lkQB_ABqXNBt87Poo0XJFAqUIfeS1Z8HIe2A7oNT8cRYBzZt5mk9Po4fQOSULSom-Wq7Xdb1ghFYLSQQnSu2hMy0VLaXWgrGS7aMZ41IUShBxgOb_By4O0YxQzQtRcXKM5im9EUIqLdQMfTG6KPE17ryNQxu23nlb1E-rNR6Dye0QO_zp8yvmN9ia0Vif_QfgBH0aIja9w-02hB32fYaXaDI4nKPpk4UJi3hZ4ykCjyZ0eRix8xDA5ugtTuPPMiQ7jLtTdNSakODsb56g57vb5_qheFzdL-vrx8JXXBetko7appGOWFZKcKqpSqvp5ARXVaOJIYw1xpUgWuGAlmqCK-lMa0opgZ-gy9_YMQ7vW0h50_np0RBMD8M2baiUhP-IntCLX9QDwGaMvjNxt_mrnX8DHn10AQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>1770317709</pqid></control><display><type>conference_proceeding</type><title>21.4 A microfluidic-CMOS platform with 3D capacitive sensor and fully integrated transceiver IC for palmtop dielectric spectroscopy</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Bakhshiani, Mehran ; Suster, Michael A. ; Mohseni, Pedram</creator><creatorcontrib>Bakhshiani, Mehran ; Suster, Michael A. ; Mohseni, Pedram</creatorcontrib><description>Quantitative measurement of the complex relative dielectric permittivity (ε r ) of a material vs. frequency (i.e., dielectric spectroscopy, or DS) is a powerful monitoring technique that extracts key information on molecular characteristics of the material-under-test (MUT) via its interactions with electromagnetic waves in a broad frequency range. Despite its potential as a label-free, nondestructive, real-time and fully electrical monitoring modality for myriad applications, including structural biology, fermentation monitoring for alcoholic beverages, food safety control and clinical diagnostics, DS is still underutilized as an analytic tool in scientific research or clinical settings. This is due to the dearth of an autonomous, small-sized, low-power and portable instrument to conduct MHz-to-GHz DS measurements without requiring a microwave probe station, benchtop vector network analyzer (VNA) equipment, or large (100's of ml) sample volume.</description><identifier>ISSN: 0193-6530</identifier><identifier>ISBN: 1479962236</identifier><identifier>ISBN: 9781479962235</identifier><identifier>EISSN: 2376-8606</identifier><identifier>EISBN: 9781479962242</identifier><identifier>EISBN: 1479962244</identifier><identifier>DOI: 10.1109/ISSCC.2015.7063088</identifier><language>eng</language><publisher>IEEE</publisher><subject>Autonomous ; Clocks ; Dielectric measurement ; Dielectrics ; Electric potential ; Integrated circuits ; Mathematical analysis ; Mixers ; Monitoring ; Radio frequency ; Spectroscopy ; Three dimensional ; Voltage-controlled oscillators</subject><ispartof>2015 IEEE International Solid State Circuits Conference (ISSCC), 2015, p.1-3</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7063088$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,2051,27903,27904,54534,54899,54911</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7063088$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Bakhshiani, Mehran</creatorcontrib><creatorcontrib>Suster, Michael A.</creatorcontrib><creatorcontrib>Mohseni, Pedram</creatorcontrib><title>21.4 A microfluidic-CMOS platform with 3D capacitive sensor and fully integrated transceiver IC for palmtop dielectric spectroscopy</title><title>2015 IEEE International Solid State Circuits Conference (ISSCC)</title><addtitle>ISSCC</addtitle><description>Quantitative measurement of the complex relative dielectric permittivity (ε r ) of a material vs. frequency (i.e., dielectric spectroscopy, or DS) is a powerful monitoring technique that extracts key information on molecular characteristics of the material-under-test (MUT) via its interactions with electromagnetic waves in a broad frequency range. Despite its potential as a label-free, nondestructive, real-time and fully electrical monitoring modality for myriad applications, including structural biology, fermentation monitoring for alcoholic beverages, food safety control and clinical diagnostics, DS is still underutilized as an analytic tool in scientific research or clinical settings. This is due to the dearth of an autonomous, small-sized, low-power and portable instrument to conduct MHz-to-GHz DS measurements without requiring a microwave probe station, benchtop vector network analyzer (VNA) equipment, or large (100's of ml) sample volume.</description><subject>Autonomous</subject><subject>Clocks</subject><subject>Dielectric measurement</subject><subject>Dielectrics</subject><subject>Electric potential</subject><subject>Integrated circuits</subject><subject>Mathematical analysis</subject><subject>Mixers</subject><subject>Monitoring</subject><subject>Radio frequency</subject><subject>Spectroscopy</subject><subject>Three dimensional</subject><subject>Voltage-controlled oscillators</subject><issn>0193-6530</issn><issn>2376-8606</issn><isbn>1479962236</isbn><isbn>9781479962235</isbn><isbn>9781479962242</isbn><isbn>1479962244</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2015</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNo1kDlPAzEQhc0lkQB_ABqXNBt87Poo0XJFAqUIfeS1Z8HIe2A7oNT8cRYBzZt5mk9Po4fQOSULSom-Wq7Xdb1ghFYLSQQnSu2hMy0VLaXWgrGS7aMZ41IUShBxgOb_By4O0YxQzQtRcXKM5im9EUIqLdQMfTG6KPE17ryNQxu23nlb1E-rNR6Dye0QO_zp8yvmN9ia0Vif_QfgBH0aIja9w-02hB32fYaXaDI4nKPpk4UJi3hZ4ykCjyZ0eRix8xDA5ugtTuPPMiQ7jLtTdNSakODsb56g57vb5_qheFzdL-vrx8JXXBetko7appGOWFZKcKqpSqvp5ARXVaOJIYw1xpUgWuGAlmqCK-lMa0opgZ-gy9_YMQ7vW0h50_np0RBMD8M2baiUhP-IntCLX9QDwGaMvjNxt_mrnX8DHn10AQ</recordid><startdate>201502</startdate><enddate>201502</enddate><creator>Bakhshiani, Mehran</creator><creator>Suster, Michael A.</creator><creator>Mohseni, Pedram</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>201502</creationdate><title>21.4 A microfluidic-CMOS platform with 3D capacitive sensor and fully integrated transceiver IC for palmtop dielectric spectroscopy</title><author>Bakhshiani, Mehran ; Suster, Michael A. ; Mohseni, Pedram</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i539-f87d1cbb7d0c247ed8b54c910c26385b90a022bad4e6f6de148bb757dafa477e3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Autonomous</topic><topic>Clocks</topic><topic>Dielectric measurement</topic><topic>Dielectrics</topic><topic>Electric potential</topic><topic>Integrated circuits</topic><topic>Mathematical analysis</topic><topic>Mixers</topic><topic>Monitoring</topic><topic>Radio frequency</topic><topic>Spectroscopy</topic><topic>Three dimensional</topic><topic>Voltage-controlled oscillators</topic><toplevel>online_resources</toplevel><creatorcontrib>Bakhshiani, Mehran</creatorcontrib><creatorcontrib>Suster, Michael A.</creatorcontrib><creatorcontrib>Mohseni, Pedram</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bakhshiani, Mehran</au><au>Suster, Michael A.</au><au>Mohseni, Pedram</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>21.4 A microfluidic-CMOS platform with 3D capacitive sensor and fully integrated transceiver IC for palmtop dielectric spectroscopy</atitle><btitle>2015 IEEE International Solid State Circuits Conference (ISSCC)</btitle><stitle>ISSCC</stitle><date>2015-02</date><risdate>2015</risdate><spage>1</spage><epage>3</epage><pages>1-3</pages><issn>0193-6530</issn><eissn>2376-8606</eissn><isbn>1479962236</isbn><isbn>9781479962235</isbn><eisbn>9781479962242</eisbn><eisbn>1479962244</eisbn><abstract>Quantitative measurement of the complex relative dielectric permittivity (ε r ) of a material vs. frequency (i.e., dielectric spectroscopy, or DS) is a powerful monitoring technique that extracts key information on molecular characteristics of the material-under-test (MUT) via its interactions with electromagnetic waves in a broad frequency range. Despite its potential as a label-free, nondestructive, real-time and fully electrical monitoring modality for myriad applications, including structural biology, fermentation monitoring for alcoholic beverages, food safety control and clinical diagnostics, DS is still underutilized as an analytic tool in scientific research or clinical settings. This is due to the dearth of an autonomous, small-sized, low-power and portable instrument to conduct MHz-to-GHz DS measurements without requiring a microwave probe station, benchtop vector network analyzer (VNA) equipment, or large (100's of ml) sample volume.</abstract><pub>IEEE</pub><doi>10.1109/ISSCC.2015.7063088</doi><tpages>3</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0193-6530
ispartof 2015 IEEE International Solid State Circuits Conference (ISSCC), 2015, p.1-3
issn 0193-6530
2376-8606
language eng
recordid cdi_proquest_miscellaneous_1770317709
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Autonomous
Clocks
Dielectric measurement
Dielectrics
Electric potential
Integrated circuits
Mathematical analysis
Mixers
Monitoring
Radio frequency
Spectroscopy
Three dimensional
Voltage-controlled oscillators
title 21.4 A microfluidic-CMOS platform with 3D capacitive sensor and fully integrated transceiver IC for palmtop dielectric spectroscopy
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T00%3A19%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=21.4%20A%20microfluidic-CMOS%20platform%20with%203D%20capacitive%20sensor%20and%20fully%20integrated%20transceiver%20IC%20for%20palmtop%20dielectric%20spectroscopy&rft.btitle=2015%20IEEE%20International%20Solid%20State%20Circuits%20Conference%20(ISSCC)&rft.au=Bakhshiani,%20Mehran&rft.date=2015-02&rft.spage=1&rft.epage=3&rft.pages=1-3&rft.issn=0193-6530&rft.eissn=2376-8606&rft.isbn=1479962236&rft.isbn_list=9781479962235&rft_id=info:doi/10.1109/ISSCC.2015.7063088&rft.eisbn=9781479962242&rft.eisbn_list=1479962244&rft_dat=%3Cproquest_6IE%3E1770317709%3C/proquest_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i539-f87d1cbb7d0c247ed8b54c910c26385b90a022bad4e6f6de148bb757dafa477e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1770317709&rft_id=info:pmid/&rft_ieee_id=7063088&rfr_iscdi=true