Development of Certified Reference Materials and Methods of Calibration of Small-Angle X-Ray Diffractometers for Certification and Standardization of Articles Produced by Nanoindustry

Certified reference materials of the thickness of bilayers of Langmuir–Blodgett lead stearate PbSt 2 films on a quartz substrate and methods of calibration of small-angle x-ray diffractors with the use of the films are developed.

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Bibliographic Details
Published in:Measurement techniques 2013-12, Vol.56 (9), p.992-998
Main Authors: Avilov, A. S., Baturin, A. S., Volkov, V. V., D’yakova, Yu. A., Ermakova, M. A., Kuzin, A. Yu, Marchenkova, M. A., Mityukhlyaev, V. B., Seregin, A. Yu, Sul’yanov, S. N., Tereshchenko, E. Yu, Todua, P. A.
Format: Article
Language:English
Subjects:
Analysis
Analytical Chemistry
Calibration
Certification
Characterization and Evaluation of Materials
Dielectric films
Diffraction
Diffractometers
International
Langmuir-Blodgett films
Measurement Science and Instrumentation
Measurement techniques
Measuring instruments
Methods
Nanometrology
Phase transitions
Physical Chemistry
Physics
Physics and Astronomy
Radiation
Reference materials
Studies
Thin films
X-rays
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Description
Summary:Certified reference materials of the thickness of bilayers of Langmuir–Blodgett lead stearate PbSt 2 films on a quartz substrate and methods of calibration of small-angle x-ray diffractors with the use of the films are developed.
ISSN:0543-1972
1573-8906
DOI:10.1007/s11018-013-0318-7