Validation and comparable analysis of aluminum in the popular Chinese fried bread youtiao by wavelength dispersive XRF

• Published in: Food chemistry 2016-09, Vol.207, p.1-5
• Main Authors: Hua, Hongying, Jiang, Xiaofei, Wu, Shimin
• Format: Article
• Language: English
• Subjects: Aluminum; Aluminum - adverse effects; Aluminum - analysis; Bread - analysis; Flour products; Inductively coupled plasma optical emission spectrometry; Spectrometry, X-Ray Emission - methods; Wavelength dispersive X-ray fluorescence; Youtiao
• ISSN: 0308-8146; 1873-7072
• DOI: 10.1016/j.foodchem.2016.03.067

•The WDXRF method was employed to determine the Al content of youtiao samples.•WDXRF was effective for rapid and straightforward measurement of Al in youtiao.•The results obtained by WDXRF were found to be similar to those of ICP-OES.•WDXRF could replace ICP-OES method of Al determination in youtiao. Aluminum (Al) is an element in alum commonly used as a raising agent for Chinese flour products, especially for a typical fried food youtiao. In the present study, the feasibility of wavelength dispersive X-ray fluorescence spectrometry (WDXRF) for analysis of aluminum levels in youtiao was examined. Youtiao samples spiked with known amounts of aluminum were used for calibration. Linearity, accuracy, precision, and detection and quantification limits were tested, based on three calibration curves. For further validation, test youtiao samples were analyzed by both WDXRF and inductively coupled plasma optical emission spectrometry (ICP-OES). Comparison of the two methods showed that measurement performance was not significantly different. Taken together, these results indicate that WDXRF can form the basis of a rapid and simple methodology for measuring the aluminum content of youtiao, and that it is a good candidate for replacing ICP-OES for analyzing Al-containing flour products.