Young's moduli of sputter-deposited NiTi films determined by resonant ultrasound spectroscopy: Austenite, R-phase, and martensite

Young's moduli of 3 mu m thick NiTi films sputter-deposited on silicon wafers are determined by resonant ultrasound spectroscopy. Three samples with different transition temperatures are studied; for each sample, the evolution of Young's modulus is obtained in a thermal cycle covering the...

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Bibliographic Details
Published in:Scripta materialia 2015-05, Vol.101, p.24-27
Main Authors: Thomasova, Martina, Sedlak, Petr, Seiner, Hanus, Janovska, Michaela, Kabla, Meni, Shilo, Doron, Landa, Michal
Format: Article
Language:English
Subjects:
Austenite
Intermetallics
Martensite
Modulus of elasticity
Nickel base alloys
Nickel titanides
Shape memory alloys
Titanium compounds
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Summary:Young's moduli of 3 mu m thick NiTi films sputter-deposited on silicon wafers are determined by resonant ultrasound spectroscopy. Three samples with different transition temperatures are studied; for each sample, the evolution of Young's modulus is obtained in a thermal cycle covering the austenite R-phase martensite transition sequence. The results prove that the smallest Young's modulus is attained for the R-phase, and both austenite and martensite exhibit pronounced softening towards the transition temperatures.
ISSN:1359-6462
DOI:10.1016/j.scriptamat.2015.01.009