Tip-enhanced near-field optical microscopy

Tip-enhanced near-field optical microscopy (TENOM) is a scanning probe technique capable of providing a broad range of spectroscopic information on single objects and structured surfaces at nanometer spatial resolution and with highest detection sensitivity. In this review, we first illustrate the p...

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Bibliographic Details
Published in:Chemical Society reviews 2014-02, Vol.43 (4), p.1248-1262
Main Authors: Mauser, Nina, Hartschuh, Achim
Format: Article
Language:English
Subjects:
Antennas
detection limit
electric current
electrochemiluminescence
Electroluminescence
Fluorescence
light microscopy
Nanostructure
Optical microscopy
Photocurrent
Raman scattering
Scanning
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Summary:Tip-enhanced near-field optical microscopy (TENOM) is a scanning probe technique capable of providing a broad range of spectroscopic information on single objects and structured surfaces at nanometer spatial resolution and with highest detection sensitivity. In this review, we first illustrate the physical principle of TENOM that utilizes the antenna function of a sharp probe to efficiently couple light to excitations on nanometer length scales. We then discuss the antenna-induced enhancement of different optical sample responses including Raman scattering, fluorescence, generation of photocurrent and electroluminescence. Different experimental realizations are presented and several recent examples that demonstrate the capabilities of the technique are reviewed. Tip-enhanced near-field optical microscopy is reviewed and shown to provide diverse sample information at nanometer spatial resolution.
ISSN:0306-0012
1460-4744
1460-4744
DOI:10.1039/c3cs60258c