A single probe for imaging photons, electrons and physical forces

The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) perm...

Full description

Saved in:
Bibliographic Details
Published in:Nanotechnology 2016-06, Vol.27 (23), p.235705-235705
Main Authors: Pilet, Nicolas, Lisunova, Yuliya, Lamattina, Fabio, Stevenson, Stephanie E, Pigozzi, Giancarlo, Paruch, Patrycja, Fink, Rainer H, Hug, Hans J, Quitmann, Christoph, Raabe, Joerg
Format: Article
Language:English
Subjects:
Accessibility
carbon nanotube
co-axial tip
Detectors
electron
Engineering and Technology
Microscopy
Nano Technology
Nanostructure
Nanoteknik
photon detection
Photons
Scanning
Scanning force microscopy
scanning probe
Teknik
x-ray microscopy
X-rays
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements. Just by the variation of one parameter, the SFM probe can be utilised to detect either sample photo-emitted electrons or transmitted photons. This allows the use of a single probe to detect electrons, photons and physical forces of interest. We also show recent progress and demonstrate the current limitations of using a high aspect ratio coaxial SFM probe to detect photo-emitted electrons with very high lateral resolution. Novel probe designs are proposed to further progress in using an SFM probe as a STXM detector.
ISSN:0957-4484
1361-6528
DOI:10.1088/0957-4484/27/23/235705