A single probe for imaging photons, electrons and physical forces

• Published in: Nanotechnology 2016-06, Vol.27 (23), p.235705-235705
• Main Authors: Pilet, Nicolas, Lisunova, Yuliya, Lamattina, Fabio, Stevenson, Stephanie E, Pigozzi, Giancarlo, Paruch, Patrycja, Fink, Rainer H, Hug, Hans J, Quitmann, Christoph, Raabe, Joerg
• Format: Article
• Language: English
• Subjects: Accessibility; carbon nanotube; co-axial tip; Detectors; electron; Engineering and Technology; Microscopy; Nano Technology; Nanostructure; Nanoteknik; photon detection; Photons; Scanning; Scanning force microscopy; scanning probe; Teknik; x-ray microscopy; X-rays
• ISSN: 0957-4484; 1361-6528
• DOI: 10.1088/0957-4484/27/23/235705

The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements. Just by the variation of one parameter, the SFM probe can be utilised to detect either sample photo-emitted electrons or transmitted photons. This allows the use of a single probe to detect electrons, photons and physical forces of interest. We also show recent progress and demonstrate the current limitations of using a high aspect ratio coaxial SFM probe to detect photo-emitted electrons with very high lateral resolution. Novel probe designs are proposed to further progress in using an SFM probe as a STXM detector.