Measurements of charge transfer efficiency in a proton-irradiated swept charge device

• Published in: Chinese physics C 2014-06, Vol.38 (6), p.40-44
• Main Author: 王于仨 杨彦佶 陈勇 刘晓艳 崔苇苇 徐玉朋 李承奎 李茂顺 李炜 胡渭 张艺 陆波 尹国和 朱玥 张子良
• Format: Article
• Language: English
• Subjects: Charge; Charge transfer; Devices; Energy resolution; Low energy; Operating temperature; X-ray telescopes; X-rays; X射线CCD; X射线天文卫星; 充电装置; 测量; 电荷转移效率; 硬X射线调制望远镜; 质子辐照; 高能量分辨率
• ISSN: 1674-1137; 0254-3052
• DOI: 10.1088/1674-1137/38/6/066001

Charged Coupled Devices （CCDs） have been successfully used in several low energy X-ray astronomical satellites over the past two decades. Their high energy resolution and high spatial resolution make them a perfect tool for low energy astronomy, such as observing the formation of galaxy clusters and the environment around black holes. The Low Energy X-ray Telescope （LE） group is developing a Swept Charge Device （SCD） for the Hard X- ray Modulation Telescope （HXMT） satellite. A SCD is a special low energy X-ray CCD, which can be read out a thousand times faster than traditional CCDs, simultaneously keeping excellent energy resolution. A test method for measuring the charge transfer efficiency （CTE） of a prototype SCD has been set up. Studies of the charge transfer inefficiency （CTI） with a proton-irradiated SCD have been performed at a range of operating temperatures. The SCD is irradiated by 3× 10Sere-2 10 MeV protons.