The Effect of By-pass Current on the Accuracy of Resistivity Measurement in a Diamond Anvil Cell

We report a quantitative analysis of by-pass current effect on the accuracy of resistivity measurement in a diamond anvil cell. Due to the by-pass current, the sample resistivity calculated by the van der Pauw method is obviously smaller than the actual value and the problem becomes more serious for...

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Bibliographic Details
Published in:Chinese physics letters 2013, Vol.30 (6), p.060701-1-060701-3, Article 060701
Main Authors: YANG, Jie, PENG, Gang, LIU, Cai-Long, LU, Han, HAN, Yong-Hao, GAO, Chun-Xiao
Format: Article
Language:English
Subjects:
Chambers
Current density
Diamond anvil cells
Electrical resistivity
Insulating layers
Mathematical analysis
Quantitative analysis
Walls
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Summary:We report a quantitative analysis of by-pass current effect on the accuracy of resistivity measurement in a diamond anvil cell. Due to the by-pass current, the sample resistivity calculated by the van der Pauw method is obviously smaller than the actual value and the problem becomes more serious for a high-resistivity sample. For the consideration of high accuracy of resistivity measurement, a method is presented that the inside wall of the sample chamber should be covered by a polymethylmethane layer. With this highly insulating layer, the by-pass current is effectively prevented and the current density distribution inside the sample is very close to the ideal case.
ISSN:0256-307X
1741-3540
DOI:10.1088/0256-307X/30/6/060701