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Development of New Photosensitive Low CTE Materials
We developed a new negative type photosensitive material with the phenolic resin. The film of the material cured at 260oC showed low coefficients of thermal expansion (CTE), low residual stress and good heat resistance. And the material exhibited good lithography performance. Thus, we expect applica...
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Published in: | Journal of Photopolymer Science and Technology 2015/05/11, Vol.28(3), pp.407-410 |
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container_end_page | 410 |
container_issue | 3 |
container_start_page | 407 |
container_title | Journal of Photopolymer Science and Technology |
container_volume | 28 |
creator | Doi, Takashi Uno, Takaaki Nishimura, Isao Hayashi, Eiji |
description | We developed a new negative type photosensitive material with the phenolic resin. The film of the material cured at 260oC showed low coefficients of thermal expansion (CTE), low residual stress and good heat resistance. And the material exhibited good lithography performance. Thus, we expect application of this material to 3D packaging which requires low CTE and low residual stress by low temperature curing. |
doi_str_mv | 10.2494/photopolymer.28.407 |
format | article |
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source | Free Full-Text Journals in Chemistry |
subjects | Curing Lithography low CTE low residual stress Negative type photosensitive material Packaging Photopolymers Photosensitivity Residual stress Thermal resistance Three dimensional |
title | Development of New Photosensitive Low CTE Materials |
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