Development and Characterization of a Portable Total Reflection X-ray Fluorescence System Using a Waveguide for Trace Elements Analysis

This paper presents a portable total reflection X-ray fluorescence system composed of a 15 W X-ray tube, with a gold anode, a waveguide constituted by two Perspex® parallel plates, a Si PIN detector and a quartz optical flat. The critical angle of the total reflection system was experimentally deter...

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Bibliographic Details
Published in:Analytical Sciences 2014/10/10, Vol.30(10), pp.955-960
Main Authors: Ana Cristina M. da COSTA, ARAÚJO, Ubiratan B. de, Edgar F. O. de JESUS, ANJOS, Marcelino J., LOPES, Ricardo T.
Format: Article
Language:English
Subjects:
Analytical Chemistry
Chemistry
Detection limits
Detectors
Instrumentation
Portability
Reflection
Silicon
total-reflection
Trace elements
waveguide
Waveguides
X-ray fluorescence
X-ray tubes
Zinc
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Summary:This paper presents a portable total reflection X-ray fluorescence system composed of a 15 W X-ray tube, with a gold anode, a waveguide constituted by two Perspex® parallel plates, a Si PIN detector and a quartz optical flat. The critical angle of the total reflection system was experimentally determined by measuring a zinc solution (100 mg/L). The accuracy of the system was checked using SRM 1577b Bovine Liver by NIST as standard reference material. We obtained the absolute detection limits of the following elements: P (450 ± 40 ng), S (200 ± 31 ng), K (30 ± 2.5 ng), Ca (19 ± 3.5 ng), Mn (4.1 ± 0.5 ng), Fe (3.6 ± 0.9 ng), Cu (3.3 ± 0.4 ng) and Zn (3.5 ± 0.3 ng). This paper shows that it is possible to produce total reflection X-ray fluorescence with very compact, efficient, low-cost and easy-to-handle instrumentation using a low-power X-ray tube and a Si PIN compact detector.
ISSN:0910-6340
1348-2246
DOI:10.2116/analsci.30.955