Detection efficiency characteristics of free-running InGaAs/InP single photon detector using passive quenching active reset IC

InGaAs/InP avalanche photodiodes （APD） are rarely used in a free-running regime for near-infrared single photon detection. In order to overcome the detrimental afterpulsing, we demonstrate a passive quenching active reset integrated circuit. Taking advantage of the inherent fast passive quenching pr...

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Bibliographic Details
Published in:Chinese physics B 2016-01, Vol.25 (1), p.460-464
Main Author: 郑福 王超 孙志斌 翟光杰
Format: Article
Language:English
Subjects:
Counting
Detectors
Indium phosphides
InGaAs/InP
InP/InGaAs
Integrated circuits
Photodiodes
Photon avalanches
Photons
Quenching
单光子探测器
复位IC
效率特性
活性
猝灭
运行状态
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Summary:InGaAs/InP avalanche photodiodes （APD） are rarely used in a free-running regime for near-infrared single photon detection. In order to overcome the detrimental afterpulsing, we demonstrate a passive quenching active reset integrated circuit. Taking advantage of the inherent fast passive quenching process and active reset to reduce reset time, the integrated circuit is useful for reducing afterpulses and is also area-efficient. We investigate the free-running single photon detector＇s afterpulsing effect, de-trapping time, dark count rate, and photon detection efficiency, and also compare with gated regime operation. After correction for deadtime and afterpulse, we find that the passive quenching active reset free-running single photon detector＇s performance is consistent with gated operation.
ISSN:1674-1056
2058-3834
1741-4199
DOI:10.1088/1674-1056/25/1/010306