Nano-optical single-photon response mapping of waveguide integrated molybdenum silicide (MoSi) superconducting nanowires

We present low temperature nano-optical characterization of a silicon-on-insulator (SOI) waveguide integrated SNSPD. The SNSPD is fabricated from an amorphous Mo Si thin film chosen to give excellent substrate conformity. At 350 mK, the SNSPD exhibits a uniform photoresponse under perpendicular illu...

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Bibliographic Details
Published in:Optics express 2016-06, Vol.24 (13), p.13931-13938
Main Authors: Li, Jian, Kirkwood, Robert A, Baker, Luke J, Bosworth, David, Erotokritou, Kleanthis, Banerjee, Archan, Heath, Robert M, Natarajan, Chandra M, Barber, Zoe H, Sorel, Marc, Hadfield, Robert H
Format: Article
Language:English
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Summary:We present low temperature nano-optical characterization of a silicon-on-insulator (SOI) waveguide integrated SNSPD. The SNSPD is fabricated from an amorphous Mo Si thin film chosen to give excellent substrate conformity. At 350 mK, the SNSPD exhibits a uniform photoresponse under perpendicular illumination, corresponding to a maximum system detection efficiency of approximately 5% at 1550 nm wavelength. Under these conditions 10 Hz dark count rate and 51 ps full width at half maximum (FWHM) timing jitter is observed.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.24.013931