Spectrally resolved white light interferometry to measure material dispersion over a wide spectral band in a single acquisition

In this paper we apply spectrally resolved white light interferometry to measure refractive and group index over a wide spectral band from 400 to 1000 nm. The output of a Michelson interferometer is spectrally decomposed by a homemade prism spectrometer with a high resolution camera. The group index...

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Bibliographic Details
Published in:Optics express 2016-07, Vol.24 (15), p.17303-17312
Main Authors: Arosa, Yago, Lago, Elena López, Varela, Luis Miguel, de la Fuente, Raúl
Format: Article
Language:English
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Summary:In this paper we apply spectrally resolved white light interferometry to measure refractive and group index over a wide spectral band from 400 to 1000 nm. The output of a Michelson interferometer is spectrally decomposed by a homemade prism spectrometer with a high resolution camera. The group index is determined directly from the phase extracted from the spectral interferogram while the refractive index is estimated once its value at a given wavelength is known.
ISSN:1094-4087
1094-4087
DOI:10.1364/oe.24.017303