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MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter
Megaelectronvolt-Secondary Ion Mass Spectrometry (MeV-SIMS) is an emerging Ion Beam Analysis technique for molecular speciation and submicron imaging. Various setups have been constructed in the recent years. Still a systematic investigation on the dependence of MeV-SIMS yields on different ion beam...
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Published in: | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2016-03, Vol.371, p.194-198 |
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container_end_page | 198 |
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container_start_page | 194 |
container_title | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms |
container_volume | 371 |
creator | Stoytschew, Valentin Bogdanović Radović, Iva Demarche, Julien Jakšić, Milko Matjačić, Lidija Siketić, Zdravko Webb, Roger |
description | Megaelectronvolt-Secondary Ion Mass Spectrometry (MeV-SIMS) is an emerging Ion Beam Analysis technique for molecular speciation and submicron imaging. Various setups have been constructed in the recent years. Still a systematic investigation on the dependence of MeV-SIMS yields on different ion beam parameters is missing. A reliable measurement method of the beam current down to the attoampere range is needed for this investigation. Therefore, a new detector has been added to the MeV-SIMS setup at the Ruđer Bošković Institute (RBI), which measures the current directly using a Si PIN-diode. In this work, we present the constructed system, its characteristics, and results of the first yield measurements. These measurements have already identified important factors that have to be considered while constructing a MeV SIMS setup. |
doi_str_mv | 10.1016/j.nimb.2015.11.020 |
format | article |
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issn | 0168-583X 1872-9584 |
language | eng |
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source | ScienceDirect Freedom Collection |
subjects | Analytical techniques Construction Current Diodes Electronic stopping Ion beams Ion currents Measurement methods MeV SIMS Molecular analysis Silicon Speciation Yield |
title | MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter |
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