Establishment and application of the 0/45 reflectance factor scale over the shortwave infrared

This paper describes the establishment and application of the 0/45 reflectance factor scale in the shortwave infrared (SWIR) from 1100 to 2500 nm. Design, characterization, and the demonstration of a four-stage, extended indium-gallium-arsenide radiometer to perform reflectance measurements in the S...

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Bibliographic Details
Published in:Applied optics (2004) 2015-04, Vol.54 (10), p.3064-3071
Main Authors: Cooksey, Catherine C, Allen, David W, Tsai, Benjamin K, Yoon, Howard W
Format: Article
Language:English
Subjects:
Diffusers
Federal budgets
Infrared
Radiometers
Reflectance
Reflectivity
Reflectometers
Spectral reflectance
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Summary:This paper describes the establishment and application of the 0/45 reflectance factor scale in the shortwave infrared (SWIR) from 1100 to 2500 nm. Design, characterization, and the demonstration of a four-stage, extended indium-gallium-arsenide radiometer to perform reflectance measurements in the SWIR have been previously discussed. Here, we focus on the incorporation of the radiometer into the national reference reflectometer, its validation through comparison measurements, and the uncertainty budget. Next, this capability is applied to the measurement of three different diffuser materials. The 0/45 spectral reflectance factors for these materials are reported and compared to their respective 6/di spectral reflectance factors.
ISSN:1559-128X
2155-3165
DOI:10.1364/AO.54.003064