Loading…

Establishment and application of the 0/45 reflectance factor scale over the shortwave infrared

This paper describes the establishment and application of the 0/45 reflectance factor scale in the shortwave infrared (SWIR) from 1100 to 2500 nm. Design, characterization, and the demonstration of a four-stage, extended indium-gallium-arsenide radiometer to perform reflectance measurements in the S...

Full description

Saved in:

Bibliographic Details
Published in:	Applied optics (2004) 2015-04, Vol.54 (10), p.3064-3071
Main Authors:	Cooksey, Catherine C, Allen, David W, Tsai, Benjamin K, Yoon, Howard W
Format:	Article
Language:	English
Subjects:	Diffusers Federal budgets Infrared Radiometers Reflectance Reflectivity Reflectometers Spectral reflectance
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!

cited_by	cdi_FETCH-LOGICAL-c394t-bac15b3ed6b81440f7b0d193b9dc4222bd6938bf197605b63f0869a2e5b2ee0d3
cites	cdi_FETCH-LOGICAL-c394t-bac15b3ed6b81440f7b0d193b9dc4222bd6938bf197605b63f0869a2e5b2ee0d3
container_end_page	3071
container_issue	10
container_start_page	3064
container_title	Applied optics (2004)
container_volume	54
creator	Cooksey, Catherine C Allen, David W Tsai, Benjamin K Yoon, Howard W
description	This paper describes the establishment and application of the 0/45 reflectance factor scale in the shortwave infrared (SWIR) from 1100 to 2500 nm. Design, characterization, and the demonstration of a four-stage, extended indium-gallium-arsenide radiometer to perform reflectance measurements in the SWIR have been previously discussed. Here, we focus on the incorporation of the radiometer into the national reference reflectometer, its validation through comparison measurements, and the uncertainty budget. Next, this capability is applied to the measurement of three different diffuser materials. The 0/45 spectral reflectance factors for these materials are reported and compared to their respective 6/di spectral reflectance factors.
doi_str_mv	10.1364/AO.54.003064
format	article
fullrecord	<record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1808064103</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1808064103</sourcerecordid><originalsourceid>FETCH-LOGICAL-c394t-bac15b3ed6b81440f7b0d193b9dc4222bd6938bf197605b63f0869a2e5b2ee0d3</originalsourceid><addsrcrecordid>eNo9kDtPwzAUhS0EoqWwMSOPDKT1O_FYVeUhVeoCEhOR7dyoQUlcbLeIf0-gheme4dPRuR9C15RMKVdiNl9PpZgSwokSJ2jMqJQZp0qeovEQdUZZ8TpCFzG-D4wUOj9HIya1yhljY_S2jMnYtombDvqETV9hs922jTOp8T32NU4bwGQmJA5Qt-CS6R3g2rjkA47OtID9HsIvFjc-pE-zB9z0dTABqkt0Vps2wtXxTtDL_fJ58Zit1g9Pi_kqc1yLlFnjqLQcKmULKgSpc0sqqrnVlRPDTlspzQtbU50rIq3iNSmUNgykZQCk4hN0e-jdBv-xg5jKrokO2tb04HexpAUpBj-U8AG9O6Au-BiHp8ptaDoTvkpKyh-j5XxdSlEejA74zbF5Zzuo_uE_hfwbYX9w3w</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1808064103</pqid></control><display><type>article</type><title>Establishment and application of the 0/45 reflectance factor scale over the shortwave infrared</title><source>Optica Publishing Group Journals</source><creator>Cooksey, Catherine C ; Allen, David W ; Tsai, Benjamin K ; Yoon, Howard W</creator><creatorcontrib>Cooksey, Catherine C ; Allen, David W ; Tsai, Benjamin K ; Yoon, Howard W</creatorcontrib><description>This paper describes the establishment and application of the 0/45 reflectance factor scale in the shortwave infrared (SWIR) from 1100 to 2500 nm. Design, characterization, and the demonstration of a four-stage, extended indium-gallium-arsenide radiometer to perform reflectance measurements in the SWIR have been previously discussed. Here, we focus on the incorporation of the radiometer into the national reference reflectometer, its validation through comparison measurements, and the uncertainty budget. Next, this capability is applied to the measurement of three different diffuser materials. The 0/45 spectral reflectance factors for these materials are reported and compared to their respective 6/di spectral reflectance factors.</description><identifier>ISSN: 1559-128X</identifier><identifier>EISSN: 2155-3165</identifier><identifier>DOI: 10.1364/AO.54.003064</identifier><identifier>PMID: 25967222</identifier><language>eng</language><publisher>United States</publisher><subject>Diffusers ; Federal budgets ; Infrared ; Radiometers ; Reflectance ; Reflectivity ; Reflectometers ; Spectral reflectance</subject><ispartof>Applied optics (2004), 2015-04, Vol.54 (10), p.3064-3071</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c394t-bac15b3ed6b81440f7b0d193b9dc4222bd6938bf197605b63f0869a2e5b2ee0d3</citedby><cites>FETCH-LOGICAL-c394t-bac15b3ed6b81440f7b0d193b9dc4222bd6938bf197605b63f0869a2e5b2ee0d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,3258,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/25967222$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Cooksey, Catherine C</creatorcontrib><creatorcontrib>Allen, David W</creatorcontrib><creatorcontrib>Tsai, Benjamin K</creatorcontrib><creatorcontrib>Yoon, Howard W</creatorcontrib><title>Establishment and application of the 0/45 reflectance factor scale over the shortwave infrared</title><title>Applied optics (2004)</title><addtitle>Appl Opt</addtitle><description>This paper describes the establishment and application of the 0/45 reflectance factor scale in the shortwave infrared (SWIR) from 1100 to 2500 nm. Design, characterization, and the demonstration of a four-stage, extended indium-gallium-arsenide radiometer to perform reflectance measurements in the SWIR have been previously discussed. Here, we focus on the incorporation of the radiometer into the national reference reflectometer, its validation through comparison measurements, and the uncertainty budget. Next, this capability is applied to the measurement of three different diffuser materials. The 0/45 spectral reflectance factors for these materials are reported and compared to their respective 6/di spectral reflectance factors.</description><subject>Diffusers</subject><subject>Federal budgets</subject><subject>Infrared</subject><subject>Radiometers</subject><subject>Reflectance</subject><subject>Reflectivity</subject><subject>Reflectometers</subject><subject>Spectral reflectance</subject><issn>1559-128X</issn><issn>2155-3165</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNo9kDtPwzAUhS0EoqWwMSOPDKT1O_FYVeUhVeoCEhOR7dyoQUlcbLeIf0-gheme4dPRuR9C15RMKVdiNl9PpZgSwokSJ2jMqJQZp0qeovEQdUZZ8TpCFzG-D4wUOj9HIya1yhljY_S2jMnYtombDvqETV9hs922jTOp8T32NU4bwGQmJA5Qt-CS6R3g2rjkA47OtID9HsIvFjc-pE-zB9z0dTABqkt0Vps2wtXxTtDL_fJ58Zit1g9Pi_kqc1yLlFnjqLQcKmULKgSpc0sqqrnVlRPDTlspzQtbU50rIq3iNSmUNgykZQCk4hN0e-jdBv-xg5jKrokO2tb04HexpAUpBj-U8AG9O6Au-BiHp8ptaDoTvkpKyh-j5XxdSlEejA74zbF5Zzuo_uE_hfwbYX9w3w</recordid><startdate>20150401</startdate><enddate>20150401</enddate><creator>Cooksey, Catherine C</creator><creator>Allen, David W</creator><creator>Tsai, Benjamin K</creator><creator>Yoon, Howard W</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20150401</creationdate><title>Establishment and application of the 0/45 reflectance factor scale over the shortwave infrared</title><author>Cooksey, Catherine C ; Allen, David W ; Tsai, Benjamin K ; Yoon, Howard W</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c394t-bac15b3ed6b81440f7b0d193b9dc4222bd6938bf197605b63f0869a2e5b2ee0d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Diffusers</topic><topic>Federal budgets</topic><topic>Infrared</topic><topic>Radiometers</topic><topic>Reflectance</topic><topic>Reflectivity</topic><topic>Reflectometers</topic><topic>Spectral reflectance</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cooksey, Catherine C</creatorcontrib><creatorcontrib>Allen, David W</creatorcontrib><creatorcontrib>Tsai, Benjamin K</creatorcontrib><creatorcontrib>Yoon, Howard W</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied optics (2004)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cooksey, Catherine C</au><au>Allen, David W</au><au>Tsai, Benjamin K</au><au>Yoon, Howard W</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Establishment and application of the 0/45 reflectance factor scale over the shortwave infrared</atitle><jtitle>Applied optics (2004)</jtitle><addtitle>Appl Opt</addtitle><date>2015-04-01</date><risdate>2015</risdate><volume>54</volume><issue>10</issue><spage>3064</spage><epage>3071</epage><pages>3064-3071</pages><issn>1559-128X</issn><eissn>2155-3165</eissn><abstract>This paper describes the establishment and application of the 0/45 reflectance factor scale in the shortwave infrared (SWIR) from 1100 to 2500 nm. Design, characterization, and the demonstration of a four-stage, extended indium-gallium-arsenide radiometer to perform reflectance measurements in the SWIR have been previously discussed. Here, we focus on the incorporation of the radiometer into the national reference reflectometer, its validation through comparison measurements, and the uncertainty budget. Next, this capability is applied to the measurement of three different diffuser materials. The 0/45 spectral reflectance factors for these materials are reported and compared to their respective 6/di spectral reflectance factors.</abstract><cop>United States</cop><pmid>25967222</pmid><doi>10.1364/AO.54.003064</doi><tpages>8</tpages></addata></record>
fulltext	fulltext
identifier	ISSN: 1559-128X
ispartof	Applied optics (2004), 2015-04, Vol.54 (10), p.3064-3071
issn	1559-128X 2155-3165
language	eng
recordid	cdi_proquest_miscellaneous_1808064103
source	Optica Publishing Group Journals
subjects	Diffusers Federal budgets Infrared Radiometers Reflectance Reflectivity Reflectometers Spectral reflectance
title	Establishment and application of the 0/45 reflectance factor scale over the shortwave infrared
url	http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T06%3A50%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Establishment%20and%20application%20of%20the%200/45%20reflectance%20factor%20scale%20over%20the%20shortwave%20infrared&rft.jtitle=Applied%20optics%20(2004)&rft.au=Cooksey,%20Catherine%20C&rft.date=2015-04-01&rft.volume=54&rft.issue=10&rft.spage=3064&rft.epage=3071&rft.pages=3064-3071&rft.issn=1559-128X&rft.eissn=2155-3165&rft_id=info:doi/10.1364/AO.54.003064&rft_dat=%3Cproquest_cross%3E1808064103%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c394t-bac15b3ed6b81440f7b0d193b9dc4222bd6938bf197605b63f0869a2e5b2ee0d3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1808064103&rft_id=info:pmid/25967222&rfr_iscdi=true