Poka Yoke system based on image analysis and object recognition

Poka Yoke is a method of quality management which is related to prevent faults from arising during production processes. It deals with "fail-sating" or "mistake-proofing". The Poka-yoke concept was generated and developed by Shigeo Shingo for the Toyota Production System. Poka Yo...

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Bibliographic Details
Published in:IOP conference series. Materials Science and Engineering 2015-11, Vol.95 (1), p.12138
Main Authors: Belu, N, Ionescu, L M, Misztal, A, Maz re, A
Format: Article
Language:English
Subjects:
Associative memory
Converters
Electronics
Embedded systems
Fault detection
Faults
Image acquisition
Image analysis
Marketing
Modules
Object recognition
Quality management
Yokes
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Summary:Poka Yoke is a method of quality management which is related to prevent faults from arising during production processes. It deals with "fail-sating" or "mistake-proofing". The Poka-yoke concept was generated and developed by Shigeo Shingo for the Toyota Production System. Poka Yoke is used in many fields, especially in monitoring production processes. In many cases, identifying faults in a production process involves a higher cost than necessary cost of disposal. Usually, poke yoke solutions are based on multiple sensors that identify some nonconformities. This means the presence of different equipment (mechanical, electronic) on production line. As a consequence, coupled with the fact that the method itself is an invasive, affecting the production process, would increase its price diagnostics. The bulky machines are the means by which a Poka Yoke system can be implemented become more sophisticated. In this paper we propose a solution for the Poka Yoke system based on image analysis and identification of faults. The solution consists of a module for image acquisition, mid-level processing and an object recognition module using associative memory (Hopfield network type). All are integrated into an embedded system with AD (Analog to Digital) converter and Zync 7000 (22 nm technology).
ISSN:1757-8981
1757-899X
DOI:10.1088/1757-899X/95/1/012138