Microstructure response of cryogenically-rolled Cu–30Zn brass to electric-current pulsing

The effect of transient electric-current pulses (ECP) on the evolution of microstructure and texture of cryogenically-rolled Cu–30Zn brass was determined. The pulsing was shown to lead to recrystallization followed by grain growth. The mean grain size in the recrystallized material was 0.5 μm, thus...

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Bibliographic Details
Published in:Journal of alloys and compounds 2016-02, Vol.659, p.184-192
Main Authors: Konkova, T., Valeev, I., Mironov, S., Korznikov, A., Korznikova, G., Myshlyaev, M.M., Semiatin, S.L.
Format: Article
Language:English
Subjects:
ANNEALING PROCESSES
Brasses
Copper
Cryogenic deformation
Cu-30Zn brass
Electric-current pulses
Electron backscatter diffraction
Evolution
Grain size
GRAIN SIZE AND SHAPE
Grain structure
Microstructure
MICROSTRUCTURES
RECRYSTALLIZATION
Surface layer
Texture
TEXTURES
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Summary:The effect of transient electric-current pulses (ECP) on the evolution of microstructure and texture of cryogenically-rolled Cu–30Zn brass was determined. The pulsing was shown to lead to recrystallization followed by grain growth. The mean grain size in the recrystallized material was 0.5 μm, thus indicating that cryogenic rolling coupled with ECP is suitable for the production of an ultrafine-grain microstructure in Cu–30Zn brass. The differences in the recrystallization texture in pulsed versus statically-annealed conditions suggested a distinct recrystallization mechanism during ECP. •Electric-current pulsing led to recrystallization and grain growth.•Recrystallization promoted a formation of ultrafine-grained microstructure.•Recrystallization mechanism during pulsing was distinct from that during static annealing.
ISSN:0925-8388
1873-4669
DOI:10.1016/j.jallcom.2015.11.059