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P-162: Accelerated Lifetime Testing of White OLED Panels for Lighting

An accelerated test method for evaluating the long‐term lifetime and color shift of white OLED panels based on device‐degradation models was proposed. We successfully estimated the lifetime and color shift of white OLED panels at standard drive conditions with a short test period.

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Bibliographic Details
Published in:SID International Symposium Digest of technical papers 2016-05, Vol.47 (1), p.1730-1733
Main Authors: Sugimoto, Kazunori, Yoshioka, Toshihiro, Kijima, Hiroaki, Ohata, Hiroshi, Miyaguchi, Satoshi, Tsutsui, Tetsuo, Takada, Noriyuki, Murata, Hideyuki
Format: Article
Language:English
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Description
Summary:An accelerated test method for evaluating the long‐term lifetime and color shift of white OLED panels based on device‐degradation models was proposed. We successfully estimated the lifetime and color shift of white OLED panels at standard drive conditions with a short test period.
ISSN:0097-966X
2168-0159
DOI:10.1002/sdtp.11046