The influence of oxidation properties on the electron emission characteristics of porous silicon

• Published in: Applied surface science 2016-09, Vol.382, p.323-330
• Main Authors: He, Li, Zhang, Xiaoning, Wang, Wenjiang, Wei, Haicheng
• Format: Article
• Language: English
• Subjects: Current density; Electron emission; Electron emission characteristics; Emission; Emitters (electron); Oxidation; Oxygen; Oxygen content; Oxygen distribution gradient; Porous silicon
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/j.apsusc.2016.04.129

[Display omitted] •Evaluated the oxidation properties of porous silicon from semi-quantitative methods.•Discovered the relationship between oxidation properties and emission characteristics.•Revealed the micro-essence of the electron emission of the porous silicon. In order to investigate the influence of oxidation properties such as oxygen content and its distribution gradient on the electron emission characteristics of porous silicon (PS) emitters, emitters with PS thickness of 8μm, 5μm, and 3μm were prepared and then oxidized by electrochemical oxidation (ECO) and ECO-RTO (rapid thermal oxidation) to get different oxidation properties. The experimental results indicated that the emission current density, efficiency, and stability of the PS emitters are mainly determined by oxidation properties. The higher oxygen content and the smaller oxygen distribution gradient in the PS layer, the larger emission current density and efficiency we noted. The most favorable results occurred for the PS emitter with the smallest oxygen distribution gradient and the highest level of oxygen content, with an emission current density of 212.25μA/cm2 and efficiency of 59.21‰. Additionally, it also demonstrates that thick PS layer benefits to the emission stability due to its longer electron acceleration tunnel. The FN fitting plots indicated that the effective emission areas of PS emitters can be enlarged and electron emission thresholds is decreased because of the higher oxygen content and smaller distribution gradient, which were approved by the optical micrographs of top electrode of PS emitters before and after electron emission.