Application of X-ray fluorescence in an investigation of photographic heritage

X-ray fluorescence analysis uses ionizing radiation to study the elemental composition of materials. It is widely used for many purposes, including studies of various cultural and historic relicts and objects of art. This paper summarizes our experience with X-ray fluorescence analysis and attenuate...

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Bibliographic Details
Published in:Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 2015-11, Vol.116, p.8-13
Main Authors: Čechák, T., Kopecká, I., Trojek, T., Štanzel, T., Bártová, H.
Format: Article
Language:English
Subjects:
Damage
Devices
Information dissemination
Infrared spectroscopy
Quality assessment
Reflectance
Silicon detector
Toning
X-ray fluorescence analysis
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Summary:X-ray fluorescence analysis uses ionizing radiation to study the elemental composition of materials. It is widely used for many purposes, including studies of various cultural and historic relicts and objects of art. This paper summarizes our experience with X-ray fluorescence analysis and attenuated total reflectance Fourier transform infrared spectroscopy in investigating historical photographs by means of portable spectroscopic devices. The results of these measurements provide information about the composition of historical photographs and their toning. They can be used for comparing the processes used in fabricating the photographs, for assessing the quality of the paper and, in many cases, for information about how to repair damaged parts. •Overview of the XRF technique used for investigating photographs.•XRF spectra of X-ray radiation from photographs made by various techniques.•ATR-FTIR spectra of pigments and binding agents.•Results of 2D measurements of photographs.
ISSN:0969-806X
1879-0895
DOI:10.1016/j.radphyschem.2015.05.015