Influence of surface near doping concentration on contact formation of silver thick film contacts

We investigate the properties of silver thick film contacts on phosphorus doped alkaline textured silicon surfaces with varying surface doping levels. Using scanning electron microscopy, we find that the surface near doping concentration influences the formation of silver crystallites especially tho...

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Bibliographic Details
Published in:Solar energy materials and solar cells 2016-08, Vol.153, p.25-30
Main Authors: Rothhardt, P., Meier, S., Hoenig, R., Wolf, A., Biro, D.
Format: Article
Language:English
Subjects:
Bifacial
Contact
Contact formation
Contact resistance
Crystallites
Current conduction
Doping
Doping concentration
Fingers
Formations
Screen printing
Silicon
Silver contacts
Thick films
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Summary:We investigate the properties of silver thick film contacts on phosphorus doped alkaline textured silicon surfaces with varying surface doping levels. Using scanning electron microscopy, we find that the surface near doping concentration influences the formation of silver crystallites especially those that are in direct contact with both the silicon surface and the contact finger. The observed correlation between direct silver crystallite imprint coverage and specific contact resistance allows for extracting the specific contact resistance of individual crystallites to be approximately 3.3µΩcm2, which agrees well with theoretical predictions. Furthermore we present a new approach that allows for a quantitative separation of direct and indirect current conduction channels. For our experimental conditions, the assumption of current conduction exclusively by transport through silver crystallites adequately describes the experimental data. Finally we fabricate bifacial n-type solar cells with peak efficiencies of 19.9%.
ISSN:0927-0248
1879-3398
DOI:10.1016/j.solmat.2016.03.030