Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing

This paper proposes a power integrity control technique for dynamically controlling power supply voltage fluctuations for a device under test (DUT), and demonstrates its effectiveness for eliminating the overkills/underkills due to the difference of power supply impedance between an automatic test e...

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Bibliographic Details
Published in:Journal of electronic testing 2016-06, Vol.32 (3), p.257-271
Main Authors: Ishida, Masahiro, Nakura, Toru, Kusaka, Takashi, Komatsu, Satoshi, Asada, Kunihiro
Format: Article
Language:English
Subjects:
CAE) and Design
Circuits and Systems
Compensation
Computer-Aided Engineering (CAD
Control equipment
Devices
Electric potential
Electrical Engineering
Electronics
Engineering
Integrity
Power supplies
Tests
Voltage
Waveforms
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Summary:This paper proposes a power integrity control technique for dynamically controlling power supply voltage fluctuations for a device under test (DUT), and demonstrates its effectiveness for eliminating the overkills/underkills due to the difference of power supply impedance between an automatic test equipment (ATE) and a practical operating environment of the DUT. The proposed method injects compensation currents into the power supply nodes on the ATE system in a feed-forward manner such that the ATE power supply waveform matches with the one on the customer’s operating environment of the DUT. A method for calculating the compensation current is also described. Experimental results show that the proposed method can emulate the power supply voltage waveform under a customer’s operating condition and eliminate 95 % of overkills/underkills in the maximum operating frequency testing with 105 real silicon devices. Limitations and applications of the proposed method are also discussed.
ISSN:0923-8174
1573-0727
DOI:10.1007/s10836-016-5582-4