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Microstructure and magnetic properties of Fe sub(72.5)Si sub(14.2)B sub(8.7)Nb sub(2)Mo sub(1.5)Cu sub(1.1)Fe72.5Si14.2B8 .7Nb2Mo1.5Cu1.1 thin films

This paper surveys structure and magnetic properties of the thin films with thicknesses of 30, 70, 100 and 200 nm, prepared by high-frequency ion-plasma sputtering of Fe sub(72.5)Si sub(14.2)B sub(8.7)Nb sub(2)Mo sub(1.5)Cu sub(1.1)Fe72.5Si14.2B8 .7Nb2Mo1.5Cu1.1 target onto monocrystalline Si substr...

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Published in:	Journal of magnetism and magnetic materials 2016-10, Vol.415, p.61-65
Main Authors:	Mikhalitsynaa, E A, Kataeva, V A, Larranagab, A, Lepalovskija, V N, Turygina, A P
Format:	Article
Language:	English
Subjects:	Annealing Coercive force Coercivity Diffraction Film thickness Magnetic properties Thickness Thin films
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container_title	Journal of magnetism and magnetic materials
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creator	Mikhalitsynaa, E A Kataeva, V A Larranagab, A Lepalovskija, V N Turygina, A P
description	This paper surveys structure and magnetic properties of the thin films with thicknesses of 30, 70, 100 and 200 nm, prepared by high-frequency ion-plasma sputtering of Fe sub(72.5)Si sub(14.2)B sub(8.7)Nb sub(2)Mo sub(1.5)Cu sub(1.1)Fe72.5Si14.2B8 .7Nb2Mo1.5Cu1.1 target onto monocrystalline Si substrates. As-deposited films exhibited the roentgen-amorphous state and in-plane induced magnetic anisotropy. Their crystallization and drastic growth of the grains up to 40 nm at 460 degree C were revealed and examined by X-ray diffraction methods. Among the measured magnetic properties of the films, the magnetic anisotropy and coercivity were stressed. Their changes with the annealing temperature and film thickness were discussed. The influence of the surface roughness on the coercivity was also investigated with atomic force microscopy.
doi_str_mv	10.1016/j.jmmm.2016.01.040
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As-deposited films exhibited the roentgen-amorphous state and in-plane induced magnetic anisotropy. Their crystallization and drastic growth of the grains up to 40 nm at 460 degree C were revealed and examined by X-ray diffraction methods. Among the measured magnetic properties of the films, the magnetic anisotropy and coercivity were stressed. Their changes with the annealing temperature and film thickness were discussed. 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As-deposited films exhibited the roentgen-amorphous state and in-plane induced magnetic anisotropy. Their crystallization and drastic growth of the grains up to 40 nm at 460 degree C were revealed and examined by X-ray diffraction methods. Among the measured magnetic properties of the films, the magnetic anisotropy and coercivity were stressed. Their changes with the annealing temperature and film thickness were discussed. The influence of the surface roughness on the coercivity was also investigated with atomic force microscopy.</abstract><doi>10.1016/j.jmmm.2016.01.040</doi></addata></record>
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subjects	Annealing Coercive force Coercivity Diffraction Film thickness Magnetic properties Thickness Thin films
title	Microstructure and magnetic properties of Fe sub(72.5)Si sub(14.2)B sub(8.7)Nb sub(2)Mo sub(1.5)Cu sub(1.1)Fe72.5Si14.2B8 .7Nb2Mo1.5Cu1.1 thin films
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