Structural and optical properties of a-SiO sub(x):H thin films deposited by the GJ EBP CVD method

• Published in: Physica status solidi. A, Applications and materials science Applications and materials science, 2016-07, Vol.213 (7), p.1783-1789
• Main Authors: Baranov, Evgeniy, Khmel, Sergey, Zamchiy, Alexandr, Buyko, Maxim
• Format: Article
• Language: English
• Subjects: Chemical vapor deposition; Energy gaps (solid state); Optical properties; Oxygen; Refraction; Silicon substrates; Spectra; Thin films
• ISSN: 1862-6300; 1862-6319
• DOI: 10.1002/pssa.201532959

In this work, hydrogenated amorphous silicon suboxide (a-SiO sub(x):H) thin films have been prepared by gas-jet electron beam plasma chemical vapor deposition method (GJ EBP CVD) at a substrate temperature 260 degree C. The argon to monosilane ratio R=[Ar]/[SiH sub(4)] was varied and the influence of the ratio R on the structural and optical properties was investigated. In this method, R affects an oxygen concentration in the film of the silicon suboxide. FTIR measurement showed a decrease of the oxygen concentration from 40.7 to 11% with increasing R. The analysis of FTIR spectra showed the containing a large number polysilane (Si-H sub(2)) sub(n) groups that suggest the material column structure. Optical transmission spectra were recorded to investigate the optical properties and thickness of the a-SiO sub(x):H thin films. The maximum of the growth rate is 2nms super(-1) at R=80. The optical bandgap E sub(g) was derived from Tauc plots. It was found that the increase in the oxygen concentration not only leads to the increase optical bandgap, but also to the decrease the refraction index.