In-situ stress analysis of the Zr/ZrO2 system as studied by Raman spectroscopy and deflection test in monofacial oxidation techniques

• Published in: Applied surface science 2016-11, Vol.385, p.106-112
• Main Authors: Kurpaska, L., Favergeon, J., Grosseau-Poussard, J-L., Lahoche, L., Moulin, G.
• Format: Article
• Language: English
• Subjects: Correlation; Deflection; Deflection test; Displacement; High temperature oxidation; Hydrostatics; Oxidation; Raman spectroscopy; Stress; Stresses; Zirconium dioxide; Zirconium oxide
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/j.apsusc.2016.05.074

[Display omitted] •Giving the measuring volume of the material, local and global approach of stress calculation are presented and compared.•Based on the monoclinic phase peak displacement we calculated stress in the oxide scale − local approach.•Stress in the oxide scale has been estimated using Deflection Test in Monofacial Oxidation technique − global approach. A comparison of measurements performed in in-situ conditions using Raman spectroscopy and Deflection Test in Monofacial Oxidation techniques were employed to study stress states developed in zirconia films grown at 500°C is presented. The results show a good correlation between recorded Raman peak displacement and sample deflection angle. Considering analyzed volume of the material, Raman analysis represents a local measurement while the deflection test is a global response of the material. Reported stress components: (i) hydrostatic – resulted from Raman spectroscopy and (ii) in-plane – resulted from deflection test technique have been analyzed in comparison to each of the described techniques and aim to explain the behavior of zirconia at high temperatures.