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Methods of phase reconstruction for time-averaging electronic speckle pattern interferometry

Electronic speckle pattern interferometry is useful for the qualitative depiction of the deformation profile of harmonically vibrating objects. However, extending the process to achieve quantitative results requires unwrapping the phase in the interferogram, which contains significant noise due to t...

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Bibliographic Details
Published in:Applied optics (2004) 2016-03, Vol.55 (8), p.1913-1919
Main Authors: Statsenko, T, Chatziioannou, V, Moore, T, Kausel, W
Format: Article
Language:English
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Summary:Electronic speckle pattern interferometry is useful for the qualitative depiction of the deformation profile of harmonically vibrating objects. However, extending the process to achieve quantitative results requires unwrapping the phase in the interferogram, which contains significant noise due to the speckle. Two methods to achieve accurate phase information from time-averaged speckle pattern interferograms are presented. The first is based on a direct inverse of the regions within corresponding phase intervals, and the second is based on optimization of four independent parameters. The optimization method requires less time than more commonly used algorithms and shows higher precision of the resulting surface displacement.
ISSN:1559-128X
2155-3165
DOI:10.1364/AO.55.001913