Atomic force acoustic microscopy: Influence of the lateral contact stiffness on the elastic measurements

•Elastic properties of surfaces by atomic force acoustic microscopy.•Influence of the lateral contact stiffness on the elastic measurements.•Regions on the flexural vibration curves independent of the kS/kN ratio.•Experimental study and finite element analysis of the dynamic behavior of AFM probes.•...

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Bibliographic Details
Published in:Ultrasonics 2016-09, Vol.71, p.271-277
Main Authors: Flores-Ruiz, F.J., Espinoza-Beltrán, F.J., Diliegros-Godines, C.J., Siqueiros, J.M., Herrera-Gómez, A.
Format: Article
Language:English
Subjects:
Acoustic microscopy
Acoustics
Atomic force microscopy
Beams
Contact
Contact stiffness
Elastic constants
Flexural vibrations
Mathematical analysis
Spectra
Stiffness
Ultrasonics
Vibration
Young’s modulus
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Summary:•Elastic properties of surfaces by atomic force acoustic microscopy.•Influence of the lateral contact stiffness on the elastic measurements.•Regions on the flexural vibration curves independent of the kS/kN ratio.•Experimental study and finite element analysis of the dynamic behavior of AFM probes.•This analysis reduces uncertainties in the measurements of elastic properties. Atomic force acoustic microscopy is a dynamic technique where the resonances of a cantilever, that has its tip in contact with the sample, are used to quantify local elastic properties of surfaces. Since the contact resonance frequencies (CRFs) monotonically increase with the tip-sample contact stiffness, they are used to evaluate the local elastic properties of the surfaces through a suitable contact mechanical model. The CRFs depends on both, normal and lateral contact stiffness, kN and kS respectively, where the last one is taken either as constant (kS
ISSN:0041-624X
1874-9968
DOI:10.1016/j.ultras.2016.07.003