Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties

Scanning Electron microscopy and Atomic Force Microscopy and X-ray photoemission spectroscopy were used to investigate the effect of argon ion bombardment on the surface of CdZnTe crystal structural morphology. The sample was irradiated by defined doses of 5keV argon ions. We observed sudden increas...

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Bibliographic Details
Published in:Surface & coatings technology 2016-11, Vol.306, p.75-81
Main Authors: Šik, O., Bábor, P., Škarvada, P., Potoček, M., Trčka, T., Grmela, L., Belas, E.
Format: Article
Language:English
Subjects:
Argon
Atomic force microscopy
Cadmium telluride
Cadmium zinc tellurides
Craters
Irradiation
Roughness
Surface ion modification
Surface reconstruction
Surface roughness
Surface structure
Waviness
X-ray photoelectron spectroscopy
XPS
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Summary:Scanning Electron microscopy and Atomic Force Microscopy and X-ray photoemission spectroscopy were used to investigate the effect of argon ion bombardment on the surface of CdZnTe crystal structural morphology. The sample was irradiated by defined doses of 5keV argon ions. We observed sudden increase of the surface roughness at low doses. After irradiation by higher doses up to 1.4×1016ions/cm2, the surface showed smoothening. This value proved to be optimal for oxidized damaged layer removal and surface smoothening. AFM analysis confirmed lowest roughness of the surface. Higher values of ion fluences caused increasing roughness and waviness of the surface and creation of craters on the surface. The XPS analysis showed no preferential removal of Cd, Zn or Te by used ion irradiation doses. The sputter rate stabilized from ion fluences higher than 7×1015Ar+ ions/cm2. The possible origin of this craters and their cross-like alignment is explained. •The fluence of 1.4 x 1016 Ar+ ions / cm2 with energy of 5 keV was found to be ideal for removal of damaged surface layer of CdZnTe crystal•Ion fluences below 1016 Ar+ ions / cm2 showed incomplete removal of the damaged surface layer•XPS analysis showed constant stoichiometry of the surface for all used ion fluences•Locations of Argon ion bombardment etching pits are related to presence Te inclusions just below the surface•Sputter rate was constant from value from the dose 7×1015 Ar+ions / cm2
ISSN:0257-8972
1879-3347
DOI:10.1016/j.surfcoat.2016.05.006