Annealing effect on native-oxide/Si(111) interfaces studied by second-harmonic generation

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Bibliographic Details
Published in:Physical review. B, Condensed matter Condensed matter, 1995-05, Vol.51 (20), p.14717-14720
Main Authors: Hirayama, H, Watanabe, K
Format: Article
Language:English
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ISSN:0163-1829
1095-3795
DOI:10.1103/PhysRevB.51.14717